| 摘要 |
<p>The smart card has a single input/output pin (I/O) to allow the microcontroller (12) to communicate with the outside. Interface registers (16) between a peripheral device (14) and the microcontroller can be connected as a shift register forming a test exploration path that is accessible by serial communication, timed by the clock signal applied to the clock pin of the peripheral. A test assistance circuit (18) initiates the connection of the registers in the test configuration when a test bit accessible through the I/O line is validated and the I/O pin is forced from the outside to a state different to its default state.</p> |
