发明名称 PHASE COMPARISON CIRCUIT, DLL CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To shorten the lock-up time of a DLL circuit at the application time of a power supply, etc., by outputting a prescribed number of pulse signals according to the phase difference between a comparison reference signal and a comparison object signal. SOLUTION: The latch circuits 425 and 426 of a phase comparison circuit 31 latch the states of flip-flop circuits 421 and 422 consisting of the NAND gates. An activation signal generation circuit 424 generates the activation signals of both circuits 425 and 426, and a delay circuit 423 decides the phase allowance value of an external clock signal ϕext (Ref). Meanwhile, the latch circuits 415 and 416 latch the states of flip-flop circuits 411 and 412. Then a delay circuit 413 decides the phase allowance value of the signal ϕext (Ref), and a delay circuit 414 delays a comparison object signal ϕout (In) by an extent equivalent to four delay components. Then a prescribed number of pulse signals are outputted according to the phase difference between both signals ϕext and ϕout, and a delay control circuit 32 is shifted by plural steps.
申请公布号 JPH10285016(A) 申请公布日期 1998.10.23
申请号 JP19970092455 申请日期 1997.04.10
申请人 FUJITSU LTD 发明人 ETO SATOSHI
分类号 H03L7/00;G06F1/10;G11C7/22;G11C11/407;G11C11/4076;H03K5/13;H03L7/081;H03L7/085;H03L7/087;H03L7/089 主分类号 H03L7/00
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