发明名称 |
Temperature-measuring-resistor, manufacturing method therefor, and infrared - ray detecting element using the same |
摘要 |
The invention relates to a temperature-measuring-resistor which comprises vanadium oxide as a matrix material. The matrix material further contains at least one member selected from a metal, a metal oxide and a metal nitride, and the member has an electric conductivity higher than that of the vanadium oxide. The temperature-measuring-resistor has a low room temperature resistivity, and a volume resisivity that varies greatly with temperature.
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申请公布号 |
US5805049(A) |
申请公布日期 |
1998.09.08 |
申请号 |
US19960657191 |
申请日期 |
1996.06.03 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
YAMADA, AKIRA;SATO, TAKEHIKO;HONDA, TOSHIHISA;UMEMURA, TOSHIO;UCHIKAWA, FUSAOKI |
分类号 |
G01K7/16;G01J5/02;G01J5/20;H01C3/04;H01C7/04;(IPC1-7):H01C3/04 |
主分类号 |
G01K7/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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