发明名称 |
APPARATUS FOR INSPECTING PACKAGED COMPONENT |
摘要 |
PROBLEM TO BE SOLVED: To highly accurately detect the position of an electronic component free from the influence of a thickness and packaging density in inspecting packaged components. SOLUTION: An image of an electronic component packaged on a substrate is picked up by an image input means 104 and stored in an image memory 105. A scanning angle detecting means 106 detects edges of the electronic component from a plurality of profiles for an inspection region to obtain an approximate position and inclination, and detects edges from a plurality of slantly horizontal and vertical profiles according to the inclination. A horizontal edge detecting means 107 and a vertical edge detecting means 108 for detecting a combination of rising and falling edges corresponding to a component size as a pair of horizontal and vertical edges are used to calculate a position and inclination of the electronic component from the obtained pair. A component position determination means 109 for comparing the calculated position and inclination with a preset reference position from a reference data storage means 110 for determination is provided, thereby enabling highly accurate and highly reliable inspection free from the influence of a thickness of the electronic component or packaging density. |
申请公布号 |
JPH10221035(A) |
申请公布日期 |
1998.08.21 |
申请号 |
JP19970021198 |
申请日期 |
1997.02.04 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NARUOKA TOMONOBU;KAWAMURA HIDEAKI;MARUYAMA YUJI;MIZUOKA YASUSHI;OKAMOTO KENJI |
分类号 |
G01B11/24;G01N21/88;G01N21/93;G01N21/956;H05K13/08 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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