| 摘要 |
A test fixture (1) for connecting a mother board (2) to test equipment for testing the mother board (2) connected to a reference daughter board (3). The test fixture (1) comprises a first platform (35) for carrying the mother board (2) which is slidably carried on a base box (15) between a loading position and a test position. A main carrier housing (16) is moveable in the direction of the arrow A from an inoperative to a test position. A first connector (63) extends downwardly from a sub-base (27) of the carrier housing (16) for engaging corresponding connectors (10) of the mother board (2) when the carrier housing (16) is in the test position. The daughter board (3) is carried on a second platform (40) in the carrier housing (16) and is moveable in the direction of the arrow E from an inoperative to a test position for engaging a connector socket (11) on the daughter board (3) with corresponding tab connectors (5) of the mother board (2). A carrier arm (65) in the carrier housing (16), which carries second connectors (64) is moveable in the direction of the arrow G from an inoperative position to a test position for engaging the second connector (64) with corresponding connectors (8) of the mother board (2). |
