发明名称 TEST SIGNAL GENERATION DEVICE AND TEST METHOD USING IT
摘要 PROBLEM TO BE SOLVED: To set the characteristics of a synthesis test signal arbitrarily and to measure various kinds of characteristics accurately by providing a stop part for stopping the control for maintaining the power level of the synthetic test signal constantly from an external instruction. SOLUTION: A plurality of signal generation parts 3 output a code division multi-dimensional connection system modulation signal allocated to each channel, and a signal adder 5 adds it and outputs it as a synthesis test signal. A plurality of level adjustors 4 adjust the power level of the modulation signal of each channel and a level-setting part 17 individually sets the power level of each level adjustor 4. When a power level from a certain signal generator 3 fluctuates, a power level compensation part 15 controls the level of other level adjustors 4 and maintains the power level of the synthetic test signal constantly. A level compensation stop part 16 stops the control for maintaining the power level of the synthetic signal of the compensation part 15 constantly from an external instruction, thus setting the power level of the modulation signal arbitrarily as needed.
申请公布号 JPH10153630(A) 申请公布日期 1998.06.09
申请号 JP19960314876 申请日期 1996.11.26
申请人 ANRITSU CORP 发明人 ITAHARA HIROSHI
分类号 G01R31/00;H04B1/707;H04J13/00 主分类号 G01R31/00
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