| 摘要 |
PROBLEM TO BE SOLVED: To shorten test time and to reduce a price with respect to a semiconductor device constituted of combining instruction buses and data buses connected to an instruction execution unit as a common bus through a bus unit and connecting the common bus to a terminal unit. SOLUTION: In a test mode, a data bus 13 and a common bus 14 are held at a non-connected state, an instruction address bus 12A and a common address bus 14A are held at a connected state and the output terminal of an instruction generating counter 22 and an instruction data bus 13D are held at a connected state. At the time of reset, a fixed vector is outputted from a fixed vector output circuit 26 to a data bus 13D and then a count value outputted from the counter 22 in response to an instruction request signal IREQ outputted from an instruction execution unit 11 is outputted to an instruction data bus 12D as an instruction. |
