发明名称 |
CAPACITOR FORMING METHOD OF SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A fabrication method of a storage electrode is provided to enhance the surface area of the storage electrode of cylindrical capacitor. The method comprises the steps of: sequentially forming doped oxide layers(4)(6)(8) and undoped oxide layers(5)(7)(9) on a silicon substrate having a first polysilicon layer(3); selective etching the oxide layers using etchant having a selectivity in order to form an hole having convex and concave; forming a second polysilicon conductive layer(10) in the hole; forming a first spacer by slope etching the oxide layers; forming a third polysilicon layer and etching the third polysilicon layer to form a second spacer(11); and removing the oxide layers. Thereby, it is possible to increase the surface area of the storage electrode by forming a pillar having convex and concave at the center of the capacitor.
|
申请公布号 |
KR0130439(B1) |
申请公布日期 |
1998.04.07 |
申请号 |
KR19940005776 |
申请日期 |
1994.03.22 |
申请人 |
HYUNDAI ELECTRONICS CO.,LTD |
发明人 |
LIM, CHAN |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|