| 摘要 |
<p>In a semi-conductor integrated circuit device, a memory space provided with the integrated circuit device is not occupied by space for testing the integrated circuit device as the testing memory space. In the test mode of the semi-conductor integrated circuit device, test of internal circuit is capable of being implemented due to the fact that it permits a part of region belonging to the integrated circuit device to allocate to outer memory space. While in a normal operation mode, degree of freedom of design of the integrated circuit device is increased by releasing the testing memory space. <IMAGE></p> |
