发明名称 Method and system for high resolution time-of-flight measurements
摘要 A method and system of measuring the differential time of flight of a signal transmitted between first and second transducers. First, multiple broadband signal pulses are transmitted in a first direction by the first transducer and received by the second transducer. Then, the received pulses are averaged to form a first received waveform. Next, multiple identical pulses are transmitted in a second direction and the received pulses are again averaged to form a second received waveform. Then, the first and second waveforms are cross-correlated. The peak of the cross-correlation data identifies a coarse measurement of the differential time of flight of the signal. Also, multiple sinusoidal signal pulses are transmitted in each direction and averaged, thereby creating third and fourth received waveforms. A first point is selected on the third waveform and first phase information is generated from a Fourier transform of the center frequency vector beginning at the first point. Then, a second point on the fourth waveform is determined by summing the first point and the coarse measurement. Second phase information is generated from a Fourier transform of the center frequency vector beginning at the second point. The second phase information is subtracted from the first phase information, and the difference is converted into a time value. That time value is added with the coarse measurement, thereby producing a precise differential time of flight measurement.
申请公布号 AU3574697(A) 申请公布日期 1998.01.07
申请号 AU19970035746 申请日期 1997.06.19
申请人 PEEK MEASUREMENT, INC. 发明人 DAVID C. TIGWEEL;ATHANASSIOS KONTOS;SETH A. COCKING
分类号 G04F10/00;G04F13/02 主分类号 G04F10/00
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