发明名称 Photoelectric position measuring system
摘要 A scanning grating is provided in a photoelectric position measuring system which has three areas per graduation period (d) arranged behind each other in the measuring direction. These areas B1, B2, B3 are structured transversely with respect to the measuring direction X in such a way that transversely diffracted light beams are directed on detectors D0, D1, D2 which are arranged transversely to the measuring direction X. The detectors generate signals which are phase-shifted with respect to each other.
申请公布号 US5689336(A) 申请公布日期 1997.11.18
申请号 US19960659336 申请日期 1996.06.06
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 HUBER, WALTER
分类号 G01B11/00;G01D5/38;(IPC1-7):G01B9/02 主分类号 G01B11/00
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