发明名称 Apparatus and method for polishing workpiece
摘要 A workpiece such as a semiconductor wafer is polished to a flat mirror finish. The workpiece is held by a top ring, and a lower surface of the workpiece is polished by pressing the workpiece against an abrasive cloth mounted on a turntable while applying an abrasive solution onto the abrasive cloth. While the workpiece is being polished, an upper surface of the semiconductor wafer is prevented from being etched by supplying a neutralizer between the upper surface of the semiconductor wafer and the holding surface of the top ring.
申请公布号 US5670011(A) 申请公布日期 1997.09.23
申请号 US19960643099 申请日期 1996.05.02
申请人 EBARA CORPORATION 发明人 TOGAWA, TETSUJI;KIMURA, NORIO
分类号 B24B37/00;B24B37/04;B24B37/30;B24B57/02;(IPC1-7):B24B7/22 主分类号 B24B37/00
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