| 摘要 |
An invalid reference detection circuit (10) is formed on a semiconductor chip having reference input terminals adapted for coupling to a reference source (12) external to the chip, a local reference source (14), and comparison circuit (15). The comparison circuit is responsive to the local reference source and a condition at the reference input terminals to detect an invalid condition at the reference input terminals and produce an output signal (17) indicative of the condition. The invalid condition at the reference input terminals may be an open circuit, a voltage across the reference input terminals being below a predetermined minimum or above a predetermined maximum, and/or short circuit. An analog/digital conversion system (8) is formed on a semiconductor chip together with the invalid reference detection circuit. The reference input terminals are adapted for coupling to the conversion circuitry.
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