发明名称 TEMPERATURE DETECTING CIRCUIT
摘要 PROBLEM TO BE SOLVED: To improve the power source voltage removing ratio of a temperature detecting circuit using a band gap reference voltage circuit without being accompanied by enlargement of chip size or increase in power consumption. SOLUTION: A constant voltage signal VN obtained within a band gap reference voltage circuit 1 is increased prescribed-fold by a buffer amplifier 2 having a low output impedance to form a reference voltage VREREF. This reference voltage VREF is divided by a voltage dividing circuit 3 to generate a divided voltage VREREF/β. In a constant-fold circuit 4 operated with the reference voltage VREF as positive power source voltage, the difference between the voltage differenceΔVBE according to the temperature change of absolute temperature obtained from both ends of a resistor R2 within the band gap reference voltage circuit and the divided voltage VREF/βdivided by the voltage dividing circuit 3 is increased prescribed-fold, and the result is outputted as a temperature detecting circuit VOUT.
申请公布号 JPH09189614(A) 申请公布日期 1997.07.22
申请号 JP19960002902 申请日期 1996.01.11
申请人 ASAHI KASEI MICRO SYST KK 发明人 NEMOTO KENJI
分类号 G01K7/00;(IPC1-7):G01K7/00 主分类号 G01K7/00
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