发明名称 WAFER
摘要 PROBLEM TO BE SOLVED: To save a space by arranging monitor patterns for inspecting semiconductor parameters, scatteringly at a plurality of spots out of the four corners of a chip. SOLUTION: Function pads 2 and monitor patterns 3-6 are arranged on a chip 1 of a semiconductor integrated circuit. Any special space for arranging monitor patterns becomes unnecessary by arranging/scattering the monitor patterns 3-6 at the four corners of a chip 1 where no pads 2 have been arranged. Besides, it becomes possible to have spaces equal to or larger than the size of the pads 2 at the four corners of the chip, if the pads 2 are arranged at positions other than the four corners of the chip 1.
申请公布号 JPH09172049(A) 申请公布日期 1997.06.30
申请号 JP19970000102 申请日期 1997.01.06
申请人 SEIKO EPSON CORP 发明人 KADOWAKI TADAO
分类号 H01L21/66;H01L21/822;H01L27/04 主分类号 H01L21/66
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