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发明名称
A METHOD FOR MEASURING A FINE CONTACT HOLE OF A SEMICONDUCTOR DEVICE
摘要
申请公布号
KR1019970010669(B1)
申请公布日期
1997.06.30
申请号
KR1019930031898
申请日期
1993.12.31
申请人
发明人
分类号
主分类号
代理机构
代理人
主权项
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