发明名称 Single electron memory cell arrangement
摘要 The memory cells each include a single electron transistor and a single electron storage element. The transistor is controlled by the charge stored in the memory element. when a read voltage is present, a current dependent on the stored charge flows through the single electron transistor without changing the stored charge. When a greater write voltage is present, the stored charge is changed. The memory cells are switched between two sets of lines which cross each other in a memory cell arrangement. The memory element includes at least a tunnel element connected to a first line via a tunnel contact and to a memory node via a second tunnel contact. The node is capacitively controlled by a gate electrode.
申请公布号 DE19621994(C1) 申请公布日期 1997.06.12
申请号 DE1996121994 申请日期 1996.05.31
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 RISCH, LOTHAR, DR., 85579 NEUBIBERG, DE;ROESNER, WOLFGANG, DR., 81739 MUENCHEN, DE
分类号 G11C11/38;G11C11/404;H01L27/10;H01L27/28;H01L51/05;(IPC1-7):G11C11/401;G11C11/40 主分类号 G11C11/38
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