发明名称 OHMIC ELECTRODE OF COMPOUND SEMICONDUCTOR AND FORMATION THEREOF
摘要 PROBLEM TO BE SOLVED: To obtain electrodes, which are low in contact resistance, with little variation and are good in stability and heat resistance, by a method wherein an Au-Si-Ni film is adhered on an N-type III-V compound semiconductor substrate and after the film is processed into electrodes, the electrodes are subjected to heat treatment of two steps of a high temperature and a low temperature in a non-oxidizing atmosphere. SOLUTION: A film 2 about 3000Åthick and comprising 89wt.% of Au, 1wt.% of Si, and 10wt.% of Ni, is adhered on an N-type GaP substrate 1, which is heated to 100 to 200 deg.C and has a carrier concentration of 1 to 3×10<17> /cm<3> , by a vacuum evaporation method. Then, the film 2 is processed into about 60-μm diameter circular electrodes 3 by a photoetching method using a KI-I2 aqueous solution as its etchant. Moreover, after being heat-treated for 30 seconds to 120 minutes at a temperature of 520 to 620 deg.C in an Ar atmosphere, the electrodes 3 are heat-treated for 30 seconds to 120 minutes at a temperature of 350 to 480 deg.C or are cooled in a furnace to about 80 deg.C at a cooling-down rate of 5 to 100 deg.C/minute. Thereby, electrodes, which are low in contact resistance with little variation and are good in stability and heat resistance, are obtained.
申请公布号 JPH09106959(A) 申请公布日期 1997.04.22
申请号 JP19950265098 申请日期 1995.10.13
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 SUZUKI KINGO;IKEDA HITOSHI
分类号 H01L21/28;H01L21/26;H01L21/324;(IPC1-7):H01L21/28 主分类号 H01L21/28
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