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发明名称
Schnelle Prüfung von Feld-Effekt-Transistoren
摘要
申请公布号
DE69217827(D1)
申请公布日期
1997.04.10
申请号
DE19926017827
申请日期
1992.10.05
申请人
ADVANCED MICRO DEVICES, INC., SUNNYVALE, CALIF., US
发明人
BOWLES, JAMES E., AUSTIN, TEXAS 78750, US
分类号
G01R31/26;G01R31/27;G11C29/50;H01L21/66;H01L21/822;H01L21/8244;H01L27/04;H01L27/11;(IPC1-7):G01R31/26;G11C29/00
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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