发明名称 Verfahren und Vorrichtung zur Messung interner Fehler
摘要 <p>A method for measuring internal defects of a specimen, comprising the steps of allowing a finely focused laser beam to be incident into a specimen from its surface and observing the scattered light of the said laser beam from inside the said specimen from the surface of the specimen and in a different direction to the optical axis of incidence of the laser beam. <IMAGE></p>
申请公布号 DE69124753(D1) 申请公布日期 1997.04.03
申请号 DE1991624753 申请日期 1991.05.21
申请人 MITSUI MINING & SMELTING CO., LTD., TOKIO/TOKYO, JP 发明人 MORIYA, KAZUO, AGEO-SHI, SAITAMA-KEN, JP;WADA, HEDIO, GRAND.DEMEURE FUKIAGE 203, KITA-ADACHIGUN, SAITAMA-KEN, JP;HIRAI, KATSUYUKI, GRAND.DEMEURE FUKIAGE 20, KITA-ADACHIGUN, SAITAMA-KEN, JP
分类号 G01N21/88;G01N21/00;G01N21/35;G01N21/3563;G01N21/359;G01N21/39;G01N21/95;G01N21/956;H01L21/66;(IPC1-7):G01N21/88 主分类号 G01N21/88
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