发明名称 MOSFET on semiconductor substrate manufacturing method
摘要 The method involves using a semiconductor substrate, having a dielectric layer (156) deposited on the source and drain regions as well as a polysilicon gate (136), compacted by heating. The dielectric layer is removed from the gate and a metal film (160) applied on top of them. Pref. the dielectric layer removal over the gate is carried out by etching. Outside of the gate, the metal film may be removed, also by etching. The dielectric layer application starts with forming a gate oxide layer on the substrate, followed by polycrystalline silicon deposition and etching.
申请公布号 DE19638793(A1) 申请公布日期 1997.04.03
申请号 DE19961038793 申请日期 1996.09.21
申请人 NATIONAL SEMICONDUCTOR CORP., SANTA CLARA, CALIF., US 发明人 WEI-MING CHUNG, HENRY, CUPERTINO, CALIF., US
分类号 H01L21/28;H01L21/336;H01L21/8238;(IPC1-7):H01L21/336 主分类号 H01L21/28
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