发明名称 METHODS AND APPARATUS FOR ANALYZING CONFIGURATION ERRORS IN A PRODUCT STRUCTURE
摘要 <p>Metric values derived from levels of indenture are used by producers to address statistically critical errors effecting producibility. The invention provides a machine implemented diagnostic method for determining the severity of an initial failure, predicts the severity of side effects of the failure and its correction, and gauges the overall effect the failure has on producibility.</p>
申请公布号 WO1997001822(A1) 申请公布日期 1997.01.16
申请号 US1996011069 申请日期 1996.06.28
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