发明名称 Sensor characteristic adjustment circuit for adjusting output characteristics of a semiconductor sensor
摘要 A sensor characteristic adjustment circuit for adjusting the offset and the sensitivity of an output of a semiconductor sensor includes a serial-parallel converter for converting serial data bits into corresponding parallel data bits, a non-volatile memory for storing the parallel data bits, and digital-to-analog converters for converting the digital bits D1 through Dm and Dm+1 through Dn into values corresponding to the offset and the sensitivity supplied to an adder and a voltage-controlled amplifier, respectively. Preferably, gates are inserted between the serial-parallel converter and the non-volatile memory to separate the non-volatile memory from the serial-parallel converter after the parallel data is written into the non-volatile memory.
申请公布号 US5587653(A) 申请公布日期 1996.12.24
申请号 US19930172192 申请日期 1993.12.23
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 ARAKI, TOHRU
分类号 G01D3/00;G01D3/02;G11C17/16;H03G3/20;H03G3/30;(IPC1-7):G01R15/00 主分类号 G01D3/00
代理机构 代理人
主权项
地址