发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: To obtain a semiconductor device for restoring a crack due to thermal stress generated at the joint part between the semiconductor chip of the semiconductor device and a base. CONSTITUTION: A semiconductor chip 1 is joined to a base 2 by a joint metal 7 whose melt point is less than 183 deg.C and the semiconductor chip 1 is sealed along with at least either of an inactive gas 8 and a reducing substance 9.</p>
申请公布号 JPH08264681(A) 申请公布日期 1996.10.11
申请号 JP19950065993 申请日期 1995.03.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 IDETA GORO;ISHIZAKI MITSUNORI;KASHIBA YOSHIHIRO
分类号 H01L23/20;(IPC1-7):H01L23/20 主分类号 H01L23/20
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