发明名称 QUALITY CONTROL SYSTEM IN PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: To obtain a quality control system in which the set condition of every production apparatus is monitored on the basis of a set reference value, for every production apparatus, decided in advance to produce a semiconductor device, whose operation is not permitted when the set condition does not match, which urges the maintenance of an installation and which prevents a defective product from being produced. CONSTITUTION: A quality control system is constituted of production apparatuses 2a to 2n which execute a prescribed working treatment to a semiconductor device according to a production process, of a central control unit 1 by which the operation of the respective production apparatuses is controlled in a centralized manner via communication lines 3a to 3n with the respective production apparatuses 2 and of a terminal 4 to which data and an instruction are input by an operator. When a condition which is set for every production apparatus does not match a preset production standard, the quality control system in production of the semiconductor device does not permit, or stops, an operation for the production, or gives a warning or urges the reset of the condition for every production apparatus and a maintenance operation so as to prevent a defective product from being produced.
申请公布号 JPH08195407(A) 申请公布日期 1996.07.30
申请号 JP19950003313 申请日期 1995.01.12
申请人 TOSHIBA CORP 发明人 NAKAJIMA NOBURU;TONEDATE TATSUROU
分类号 H01L21/50;B65G61/00;G05B19/418;G05B23/02;G06Q50/00;G06Q50/04;H01L21/02 主分类号 H01L21/50
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