发明名称 Method of chemical mechanical polishing planarization of an insulating film using an etching stop
摘要 A method of planarizing an insuating film includes the steps of preparing a semiconductor substrate; treating an uneven surface of the substrate with an organic solvent; forming an insulating film on the thus-treated surface of the substrate by a chemical vapor deposition using an organic silicon compound as a raw material or depositing SOG, forming an etching stop film having a chemical mechanical polishing etching speed slower than that of the insulating film by depositing silicon oxide or silicon oxynitride by performing a chemical vapor deposition using an inorganic silicon compound as a raw material; and etching back at least a part of the insulating film formed on the uneven surface of the substrate by a chemical mechanical polishing process using the etching stop film.
申请公布号 US5532191(A) 申请公布日期 1996.07.02
申请号 US19940216410 申请日期 1994.03.23
申请人 KAWASAKI STEEL CORPORATION 发明人 NAKANO, TADASHI;SATO, NOBUYOSHI;OHTA, TOMOHIRO;YAMAMOTO, HIROSHI
分类号 H01L21/3105;(IPC1-7):H01L21/310 主分类号 H01L21/3105
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