发明名称 |
Method of chemical mechanical polishing planarization of an insulating film using an etching stop |
摘要 |
A method of planarizing an insuating film includes the steps of preparing a semiconductor substrate; treating an uneven surface of the substrate with an organic solvent; forming an insulating film on the thus-treated surface of the substrate by a chemical vapor deposition using an organic silicon compound as a raw material or depositing SOG, forming an etching stop film having a chemical mechanical polishing etching speed slower than that of the insulating film by depositing silicon oxide or silicon oxynitride by performing a chemical vapor deposition using an inorganic silicon compound as a raw material; and etching back at least a part of the insulating film formed on the uneven surface of the substrate by a chemical mechanical polishing process using the etching stop film.
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申请公布号 |
US5532191(A) |
申请公布日期 |
1996.07.02 |
申请号 |
US19940216410 |
申请日期 |
1994.03.23 |
申请人 |
KAWASAKI STEEL CORPORATION |
发明人 |
NAKANO, TADASHI;SATO, NOBUYOSHI;OHTA, TOMOHIRO;YAMAMOTO, HIROSHI |
分类号 |
H01L21/3105;(IPC1-7):H01L21/310 |
主分类号 |
H01L21/3105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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