发明名称 |
Measurement appts. for momentum spectrum of elastically scattered X=rays |
摘要 |
The appts. comprises a polychromatic X-ray source (20), the radiation (23) from which is incident on a first horizontally arranged circular aperture (22) within a shutter (21). The scattered radiation arising from a particular horizontal plane (e.g. 33,37) in the sample (25) is then detected via a second horizontal slit aperture (29,30) by circular detectors (1-4), in the horizontal image plate (27), each circular detector corresp. to one object plane (33,37) in the sample. The sample (25) can be inclined at an angle and is moved slowly on a supporting (X-ray transparent) surface (26) so that the sample is scanned by the X-rays.
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申请公布号 |
DE4445679(A1) |
申请公布日期 |
1996.06.27 |
申请号 |
DE19944445679 |
申请日期 |
1994.12.21 |
申请人 |
PHILIPS PATENTVERWALTUNG GMBH, 22335 HAMBURG, DE |
发明人 |
MARTENS, GERHARD, DR., 24558 HENSTEDT-ULZBURG, DE |
分类号 |
G01N23/201;(IPC1-7):G01T1/36;G01N23/02 |
主分类号 |
G01N23/201 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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