Structure for testing bare integrated circuit devices,申请号GB19960002943-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Structure for testing bare integrated circuit devices
摘要
申请公布号	GB9602943(D0)	申请公布日期	1996.04.10
申请号	GB19960002943	申请日期	1996.02.13
申请人	PLESSEY SEMICONDUCTORS LIMITED	发明人
分类号	G01R31/26;G01R1/073;G01R31/28;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Storage Box Having Support Part Forming Folding Side and Its Manufacturing Method

WATER OR CHEMICAL LUQUID TANK WORKING ROBOT

Method of manufacturing a light emitting device

WIRELESS LAN AP AND SYSTEM FOR COLLECTING CUSTOMER'S INFORMATION AND TRANSMITTING ADVERTISING EVENT MESSAGE FOR OPT-IN MARKETING USING THE WIRELESS LAN AP

HIGH DUCTILITY STEEL HAVING EXCELLENT CORROSION AND WEAR RESISTANCE

Moving and Lifting Device of Table Form

The makgeolli black making a way

TEMPERATUE KEEPING APPARATUS AT LOW TEMPERATURE FOR DRAWING WIRE ROD

Aqueous solution compound polyvinyl acetate preventing cokes specialization

surface treatment device for automated guideway transit for rubber wheel

An apparatus controlling extraction steam of a top heater to improve speed regulation rate of power plant

A Method of image processing for textile inspection

Method for Manufacturing the 3D Spacer Fabric

DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR

Three-bundle folding type h eating mat using plane heater

ENDURANCE TESTING APPARATUS FOR SUSPENSION

Method for manufacturing out sole having double structure crystal transparency for shoes looking transcription design

DYNAMOMETRIC DEVICE FOR INDICATING THE REMAINING BARREL TORQUE IN A TIMEPIECE