发明名称 LOW REDUNDANCY CIRCUIT OF SEMICONDUCTOR MEMORY
摘要 <p>PURPOSE: To form a semiconductor memory device with a redundant circuit, in which a redundant efficiency is improved and the layout properties of a chip are enhanced. CONSTITUTION: A redundant memory cell array and a spare word line are mounted in a sub-memory cell array 200 in sub-memory cell arrays, and a sense amplifier 203 for the array 200 is controlled by the output signal REDBLSi of a sense-amplifier control circuit 201. Sense-amplifier control circuits 101-401 and a low decoder are controlled by the output signal REDBLK of a redundant- block selecting-signal generating circuit 202. A spare word-line driver and the redundant-block selecting-signal generating circuit 202 are controlled by the output signals RED0-3 of fuse boxes 211-214. Since the signal REDBLK reaches a logic 1 in response to the signals RED0-3 at the time of a redundant time, the operation of the sense amplifiers and the low decoder excepting the sub- memory cell array 200 is inhibited while a spare word line is selected by the spare word-line driver.</p>
申请公布号 JPH07272496(A) 申请公布日期 1995.10.20
申请号 JP19930104443 申请日期 1993.04.30
申请人 SAMSUNG ELECTRON CO LTD 发明人 GO SHIYOUCHIYORU;KIN FUMISHITA
分类号 G11C11/401;G11C29/00;G11C29/04;H01L27/10;(IPC1-7):G11C29/00 主分类号 G11C11/401
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