发明名称 FABRICATION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To ensure a capacity required for memory without varying the size of capacitor electrode and to make the surface of capacitor irregular at a temperature higher a predetermined level. CONSTITUTION:The method for making irregular the surface of polysilicon 2 or amorphous silicon deposited on a semiconductor substrate 1 comprises a step for etching the polysilicon 2 or amorphous silicon using an etching gas containing gases produced from an aqueous solution containing hydrofluoric acid and nitric acid. The method for making irregular the surface of silicon oxide 4 deposited on the semiconductor substrate 1 comprises a step for etching the silicon oxide using an etching gas containing gases produced from an aqueous solution containing hydrofluoric acid.
申请公布号 JPH07240475(A) 申请公布日期 1995.09.12
申请号 JP19940054950 申请日期 1994.03.01
申请人 NIPPON STEEL CORP 发明人 SATO KAORU
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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