发明名称 Emissivity corrected infrared method for imaging anomalous structural heat flows
摘要 A method for detecting flaws in structures using dual band infrared radiation. Heat is applied to the structure being evaluated. The structure is scanned for two different wavelengths and data obtained in the form of images. Images are used to remove clutter to form a corrected image. The existence and nature of a flaw is determined by investigating a variety of features.
申请公布号 US5444241(A) 申请公布日期 1995.08.22
申请号 US19930130486 申请日期 1993.10.01
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 DEL GRANDE, NANCY K.;DURBIN, PHILIP F.;DOLAN, KENNETH W.;PERKINS, DWIGHT E.
分类号 G01J5/00;G01N25/72;(IPC1-7):G01N21/71 主分类号 G01J5/00
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