| 摘要 |
<p>PURPOSE: To provide the burn-in control circuit of a burn-in test method which realizes a burn-in test in a package state and realizes the simultaneous test of all memory cells even in SRAM (static RAM). CONSTITUTION: A burn-in control circuit 10 receives input data from an I/O control circuit 6 and discriminates it. A burn-in signal is generated by cutting a first fuse provided in an internal part when input data is for a test. Then, the signal is sent to row/column decoders 2 and 8, the input of an address signal is ignored and all rows and columns are enabled. When data from the I/O control circuit 6 is not for the test, an internal signal for suppressing the generation of the burn-in signal by cutting a second fuse provided in the inertial part and suppressing a self operation so that it does not operate again is generated. In such a case, the row/column decoders 2 and 8 execute the regular write/ read operation in accordance with the address signal.</p> |
