发明名称 Cathode-sputtering apparatus comprising a device for measuring critical target consumption
摘要 A cathode-sputtering apparatus for the surface-coating of objects has a vacuum chamber which contains a helium-group gas, in which chamber a target cathode and an anode are arranged. A voltage for producing plasma discharges is applied to these electrodes and a magnetic field is applied, which intensifies the plasma discharges and concentrates them at the location of the target cathode. For measuring a critical target-consumption condition, at least one probe is provided in the target cathode, which probe is actuated when the target material is eroded up to the probe.
申请公布号 US5380419(A) 申请公布日期 1995.01.10
申请号 US19930057204 申请日期 1993.05.05
申请人 U.S. PHILIPS CORP.;DU PONT OPTICAL CO. 发明人 EGGERS, GERHARD F.;LANGOWSKI, HORST-CHRISTIAN
分类号 C23C14/34;H01J37/32;(IPC1-7):C23C14/34 主分类号 C23C14/34
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