发明名称 Extracted polarization intensity differential scattering for particle characterization
摘要 A particle sizing method and apparatus of the PIDS type uses randomly polarized radiation to irradiate a particle sample. Portions of the resulting side scattering pattern are decomposed to simultaneously produce, for each decomposed portion, first and second linearly polarized beams of radiation in which the respective planes of polarization of the two beams are mutually perpendicular. Each of the polarized beams is focused onto a photodetector, and the respective photodetector outputs are differentiated to provide PIDS signals that are useful in calculating a particle size distribution for the sample.
申请公布号 US6859276(B2) 申请公布日期 2005.02.22
申请号 US20030350770 申请日期 2003.01.24
申请人 COULTER INTERNATIONAL CORP. 发明人 XU RENLIANG
分类号 G01N15/02;(IPC1-7):G01N15/02 主分类号 G01N15/02
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