发明名称 |
Interferometric surface inspection machine designed to support an element on the side to be inspected |
摘要 |
Disclosed herein is an interferometric surface inspection machine which is arranged to facilitate the inspection of finished spherical lens surfaces, and which essentially includes: a surface plate formed with a through light guide opening in a predetermined position; an up-down guide means suspended from the lower side of the surface plate; an interferometer liftably supported on the up-down guide means and having a reference lens with a reference surface thereof disposed on the side of the light guide opening and in face to face relation with said light guide opening; and a lens mount portion adjustably located in a predetermined position above the light guide opening in the surface plate and adapted to support peripheral edge portions of a spherical lens element on the side of the lens surface to be inspected.
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申请公布号 |
US5377007(A) |
申请公布日期 |
1994.12.27 |
申请号 |
US19930050622 |
申请日期 |
1993.04.22 |
申请人 |
FUJI PHOTO OPTICAL CO., LTD. |
发明人 |
YASUDA, KENJI;YONEDA, MASAMI;OHI, SHIGENORI;NOGUCHI, KENICHI |
分类号 |
G01B9/02;G01B11/24;G01B11/30;G01M11/00;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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