发明名称 Interferometric surface inspection machine designed to support an element on the side to be inspected
摘要 Disclosed herein is an interferometric surface inspection machine which is arranged to facilitate the inspection of finished spherical lens surfaces, and which essentially includes: a surface plate formed with a through light guide opening in a predetermined position; an up-down guide means suspended from the lower side of the surface plate; an interferometer liftably supported on the up-down guide means and having a reference lens with a reference surface thereof disposed on the side of the light guide opening and in face to face relation with said light guide opening; and a lens mount portion adjustably located in a predetermined position above the light guide opening in the surface plate and adapted to support peripheral edge portions of a spherical lens element on the side of the lens surface to be inspected.
申请公布号 US5377007(A) 申请公布日期 1994.12.27
申请号 US19930050622 申请日期 1993.04.22
申请人 FUJI PHOTO OPTICAL CO., LTD. 发明人 YASUDA, KENJI;YONEDA, MASAMI;OHI, SHIGENORI;NOGUCHI, KENICHI
分类号 G01B9/02;G01B11/24;G01B11/30;G01M11/00;(IPC1-7):G01B9/02 主分类号 G01B9/02
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