发明名称 Test Strip Analysis System
摘要 A test strip analysis system consists of an analysis apparatus with a test strip holding means and matching test strips. The test strip holding means serves to position the test strip in a defined position relative to a measuring unit. It comprises a test strip seating means and a guide for the test strip. Exact positioning with simple handling and without sophisticated mechanical elements is achieved by the fact that at least one part of the test strip seating means, in the area in which, in the measuring position, the front section of the test strip is located, is formed as a support which is offset in height relative to the middle plane of the test field area, the test strip,,holding means comprising at the same time a pressure element which in the measuring position presses between the support and the test field area of the test strip against the side opposite the seating means of the latter. The test strip is consequently subjected to bending stress, whereby the particular distance of the at least one test field from the measuring unit is ensured.
申请公布号 CA2119816(A1) 申请公布日期 1994.10.01
申请号 CA19942119816 申请日期 1994.03.24
申请人 BOEHRINGER MANNHEIM GMBH 发明人 HOENES, JOACHIM;UNKRIG, VOLKER;STEEG, KLAUS-DIETER
分类号 G01N21/78;G01N21/86;G01N31/00;G01N31/22;G01N33/50;G01N33/52;G01N35/00;G01N35/04;(IPC1-7):G01N33/52 主分类号 G01N21/78
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