发明名称 CONTACT HOLE FORMATION OF INTEGRATED SEMICONDUCTOR CIRCUIT
摘要 PURPOSE: To form a self-aligning contact hole in an integrated semiconductor circuit with orbital patterns arranged therein on a semiconductor substrate. CONSTITUTION: Orbital patterns 3 are formed so that the interval D1 between two orbital patterns on a conductive region 2 may be wider than the interval D0 on the adjacent semiconductor substrate 1 to form the interlayer insulating layers 4 in thickness d4 meeting the inequalities of D1 /2>d4 >=D0 /2 or L1 /2>=d4 . Finally, respective steps to anisotropically etching the interlayers 4 for at least partially exposing the conductive region 2 are performed so that a contact hole 5 may at least partially expose the conductive region 2 in the deep part between the two orbital patterns 3.
申请公布号 JPH06196569(A) 申请公布日期 1994.07.15
申请号 JP19930261934 申请日期 1993.09.24
申请人 SIEMENS AG 发明人 HANNO MERUTSUNAA
分类号 H01L21/3205;H01L21/60;H01L21/768;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L21/3205
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