发明名称 Composite transversely plastic interconnect for microchip carrier
摘要 A composite transversely plastic interconnect for a microcarrier produces a carrier-to-substrate bond having low electrical resistance and high mechanical strength, significant bond height to mediate TCE mismatch between dissimilar carrier and substrate materials, and sufficient gap between the carrier and the substrate to permit effective post solder cleaning of the interconnect. A contact array consisting of solder balls is placed directly onto either of a carrier or a substrate interconnect surface with a stencil positioned to the chosen interconnect surface. The solder balls may have a selected melting temperature. Additionally, the solder balls may have a metallic coating, such as nickel or copper, or molten solder. The carrier and substrate are joined by mating an interconnect surface of each and applying heat. Solder paste may be applied to one of the interconnect surfaces to add additional height to the joint and compensate for lack of coplanarity between the carrier and the substrate.
申请公布号 US5324569(A) 申请公布日期 1994.06.28
申请号 US19930023526 申请日期 1993.02.26
申请人 HEWLETT-PACKARD COMPANY 发明人 NAGESH, VODDARAHALLI K.;MILLER, DANIEL J.;SCHUCHARD, ROBERT A.;HARGIS, JEFFREY G.
分类号 H01L23/12;B23K1/00;H01L23/498;H01R4/02;H05K3/34;(IPC1-7):B32B9/00 主分类号 H01L23/12
代理机构 代理人
主权项
地址