SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PURPOSE:To provide a semiconductor integrated circuit capable of efficiently judging normal/defective conditions even when the number of the external terminals of the semiconductor integrated circuit and its function are limited. CONSTITUTION:This semiconductor integrated circuit incorporates an inspecition circuit 3 provided with a parity checking circuit 7 for inputting the output pattern data 5 of a circuit block 2 for which input pattern data 4 for testing are supplied to be operated and parity data 6 supplied from an outside and performing parity checking in order to judge the normal/defective conditions of the circuit block 2 for realizing the prescribed function and an output circuit 8 for inputting output signals outputted from the parity checking circuit 7 and changing an output logical value at the time of taking a logical value for meaning parity check abnormality.