发明名称 |
ISOLATION METHOD AND DEVICE OF SEMICONDUCTOR |
摘要 |
forming an insulating layer on a semiconductor substrate and an open area for the definition of element separation region; forming the 1st spacer in the open area and exposing the substrate limited by the 1st spacer; forming a DSP layer with the same impurities as the substrate; heating the substrate for making a channel stopper by the diffusion of impurities from the DSP layer to the substrate; forming spacers (S) separated by the DSP layer by removing the insulating layer and depositing an oxide layer; forming an element separation region by growing the thermal oxidation layer over the whole surface of substrate.
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申请公布号 |
KR940001813(B1) |
申请公布日期 |
1994.03.09 |
申请号 |
KR19910013226 |
申请日期 |
1991.07.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YUN - KI;KIM, BYONG - RYOL |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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