首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
INSPECTING DEVICE FOR SURFACE CONDITION
摘要
申请公布号
JPH0643127(A)
申请公布日期
1994.02.18
申请号
JP19930069498
申请日期
1993.03.29
申请人
TOSHIBA CORP
发明人
KATAGAWA HIROSHI;TERADA SHIGEKI
分类号
G01N25/68;H01L21/66;(IPC1-7):G01N25/68
主分类号
G01N25/68
代理机构
代理人
主权项
地址
您可能感兴趣的专利
ANTIAIRCRAFT DEFENSIVE DEVICE
SILVER HALIDE COLOR PHOTOGRAPHIC SENSITIVE MATERIAL AND IMAGE FORMING METHOD
MANUFACTURE OF PLASMA DISPLAY PANEL
LAN REPEATER DEVICE
CD SUBCODE TRANSFER SYSTEM
BUNDLE-PACKAGED PRODUCT CONVEYING APPARATUS
PROCESSOR AND METHOD FOR INFORMATION PROCESSING AND COMPUTER-READABLE STORAGE MEDIUM STORED WITH PROGRAM
OPTICAL FIBER CONNECTOR
DISK DRIVING DEVICE
REFRIGERATING CYCLE
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM PROVIDED WITH IT
NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURE THEREOF
LIGHT RECEIVING ELEMENT AND MANUFACTURE OF THE SAME
ELECTRIC CONNECTOR
HEAT CONVEYING DEVICE
VOLTAGE CURRENT CONVERSION CIRCUIT AND FILTER CIRCUIT USING THE CIRCUIT
ZENER ZAP DIODE
HIGH BREAKDOWN VOLTAGE TYPE SEMICONDUCTOR DEVICE
NONVOLATILE SEMICONDUCTOR MEMORY AND MANUFACTURE THEREOF
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF