发明名称 A process for making a self-aligned thin film transistor.
摘要 <p>A process for making a self-aligned thin film transistor, comprising the steps of: (a) providing a gate which comprises a glass substrate (1), a transparent electrode (2) on top thereof, and a metal electrode (3) on top of said transparent electrode, (b) forming a stack by depositing over said gate a triple layer structure consisting of gate dielectric material (4), active material (5) and a top passivating dielectric (6), (c) coating the top of said triple layer with a dual-tone photoresist (7), (d) exposing said photoresist from the top through a mask having transparent areas, opaque areas and areas transparent to selective wavelengths, using broad band UV light, (e) developing the photoresist by treatment with a solvent, (f) etching the stack with a liquid etchant through to the glass substrate, (g) exposing the photoresist from the bottom through the glass substrate using near UV light, (h) developing the photoresist with a solvent, and (i) etching off the top passivating layer of the stack.</p>
申请公布号 EP0314344(B1) 申请公布日期 1993.12.29
申请号 EP19880309576 申请日期 1988.10.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HINSBERG, WILLIAM DINAN III;HOWARD, WEBSTER EUGENE;WILLSON, CARLTON GRANT
分类号 H01L21/027;H01L21/30;H01L21/336;H01L27/12;H01L29/423;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L21/84 主分类号 H01L21/027
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