发明名称 |
NOR or NAND type mask ROM - has two transistors of high and low threshold respectively, with two impurity atom regions and common impurity atom region, all of opposite conductivity to that of substrate |
摘要 |
The ROM includes Gate electrodes (7) formed in a main surface of a p-conductivity substrate (1), with an intermediate gate insulating film (6). Low concentration impurity atom regions (8) are formed using the gate electrodes as a mask. Then spacers (10) are formed at the electrode side walls. High concentration impurity atom regions are formed, using the side wall spacers as a mask. After the spacer removal, n-conductivity impurity atoms with low energy are applied by ion implantation to form through-implantation layers (60), using the gate electrodes and spacers as a mask. ADVANTAGE - Reduced prodn. time without affecting characteristics of transistors. ROM data can be written at low energy without special equipment.
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申请公布号 |
DE4311705(A1) |
申请公布日期 |
1993.10.14 |
申请号 |
DE19934311705 |
申请日期 |
1993.04.08 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
ARAI, HAJIME, ITAMI, HYOGO, JP |
分类号 |
G11C17/08;H01L21/8246;H01L27/112;(IPC1-7):H01L27/112;H01L21/72;G11C17/10 |
主分类号 |
G11C17/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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