发明名称 NOR or NAND type mask ROM - has two transistors of high and low threshold respectively, with two impurity atom regions and common impurity atom region, all of opposite conductivity to that of substrate
摘要 The ROM includes Gate electrodes (7) formed in a main surface of a p-conductivity substrate (1), with an intermediate gate insulating film (6). Low concentration impurity atom regions (8) are formed using the gate electrodes as a mask. Then spacers (10) are formed at the electrode side walls. High concentration impurity atom regions are formed, using the side wall spacers as a mask. After the spacer removal, n-conductivity impurity atoms with low energy are applied by ion implantation to form through-implantation layers (60), using the gate electrodes and spacers as a mask. ADVANTAGE - Reduced prodn. time without affecting characteristics of transistors. ROM data can be written at low energy without special equipment.
申请公布号 DE4311705(A1) 申请公布日期 1993.10.14
申请号 DE19934311705 申请日期 1993.04.08
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 ARAI, HAJIME, ITAMI, HYOGO, JP
分类号 G11C17/08;H01L21/8246;H01L27/112;(IPC1-7):H01L27/112;H01L21/72;G11C17/10 主分类号 G11C17/08
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