发明名称 METAL LAYER CONTACT FORMING METHOD
摘要 The method comprises (a) forming a second polysilicon layer (7) on a given layer and then forming a first insulation layer (3) on the whole surface including the second polysilicon layer, (b) forming Via Hole (10) by removing a part of the first insulation layer on the second polysilicon layer, (c) forming a first polysilicon layer (4) on a region including the Via Hole and connecting with the second polysilicon layer to form a second insulation layer (5) on the whole, (d) forming a contact hole (20) by removing a part of the second insulation layer on the Via Hole, and (e) forming thereon metal layer (6) and connecting with the first polysilicon layer so that the contact hole is placed on the Via Hole and its area is less than that of the Via Hole.
申请公布号 KR930008871(B1) 申请公布日期 1993.09.16
申请号 KR19900018090 申请日期 1990.11.09
申请人 HYUNDAI ELECTRONICS CO., LTD. 发明人 OH, CHUN - SHIK;LEE, SHIN - KUK;LEE, JONG - HO;KIM, CHANG - NAM
分类号 H01L21/28;H01L23/528;(IPC1-7):H01L23/528 主分类号 H01L21/28
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