Emissivity independent temperature measurement systems
摘要
An improved contactless temperature measurement system is provided which includes a workpiece, a chamber containing the workpiece with the walls thereof being substantially transmissive to radiation at wavelengths other than a given wavelength and substantially reflective at the given wavelength to remove the dependence of the apparent or measured temperature on the workpiece emissivity variations or fluctuations.
申请公布号
US5226732(A)
申请公布日期
1993.07.13
申请号
US19920876722
申请日期
1992.04.17
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人
NAKOS, JAMES S.;BAKEMAN, JR., PAUL E.;HALLOCK, DALE P.;LASKY, JEROME B.;PENNINGTON, SCOTT L.