发明名称 SENSOR AND METHOD FOR MEASUREMENT OF SELECT COMPONENTS OF A MATERIAL
摘要 2125578 9312417 PCTABS00023 A sensor (32) and method is provided for measuring one or more select components of a material (18). The method measures the components by emitting electromagnetic radiation (42) at the material (18) and detecting the intensity of the emerging radiation at the material at separate locations (36, 37) from the source (38). The sensor (32) provides a radiation source (38) for emitting radiation (42) at a sheet (18), a plurality of detecting means (70-73, 82, 83, 90, 91, 98, 99), wherein the detecting means are offset from the source (38) substantially the same or unequally, for detecting radiation (42) after interaction with the sheet (18) and first and second reflectors (28, 30) for directing the radiation for multiple interactions with the sheet (18) when moving from the source aperture (34) to the detecting means. The invention can accurately measure the select components (e.g., moisture) of different grades of paper by eliminating the effects of the scattering power and determining absorption power at each band of the spectrum considered necessary for a particular measurement.
申请公布号 CA2125578(A1) 申请公布日期 1993.06.10
申请号 CA19922125578 申请日期 1992.12.08
申请人 发明人
分类号 G01J3/51;D21F7/00;G01N21/31;G01N21/35;G01N21/86;(IPC1-7):G01N21/86 主分类号 G01J3/51
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