发明名称 AETZVERFAHREN ZUM ERZEUGEN VON LOCHOEFFNUNGEN ODER GRAEBEN IN N-DOTIERTEM SILIZIUM.
摘要 The etching process for obtaining apertures or recesses in a doped silicon substrate (1) or layer, uses an electrolysis cell contg. an acid soln. (3) with the silicon acting as the positive electrode (5). Pref. the silicon disc (6) has an applied silicon nitride etching mask and is supported in a Teflon (RTM) holder (2) sealed in contact with the acid soln. (3). The silicon disc (6) is coupled to the positive pole (5) of the voltage source via an ohmic contact (4), the negative electrode (6) supported at a given distance from the silicon disc (6) within the acid soln. (3). The required current density is obtd. by illuminating the rear surface of the silicon disc (6) with light of a given intensity.
申请公布号 DE3879771(D1) 申请公布日期 1993.05.06
申请号 DE19883879771 申请日期 1988.05.10
申请人 SIEMENS AG, 8000 MUENCHEN, DE 发明人 FOELL, DR., HELMUT;LEHMANN, VOLKER, W-8000 MUENCHEN 80, DE
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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