METHOD AND DEVICE FOR MEASURING REFRACTIVE INDEX DISTRIBUTION,申请号JP19910223131-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	METHOD AND DEVICE FOR MEASURING REFRACTIVE INDEX DISTRIBUTION
摘要
申请公布号	JPH0560654(A)	申请公布日期	1993.03.12
申请号	JP19910223131	申请日期	1991.09.03
申请人	SUMITOMO ELECTRIC IND LTD	发明人	INOUE SUSUMU;HATTORI YASUJI
分类号	G01M11/02;G01N21/41	主分类号	G01M11/02
代理机构		代理人
主权项
地址

您可能感兴趣的专利

INTERNAL STRUCTURE OF MICROWAVE OVEN

INDOOR UNIT OF AIR CONDITIONER

WAFER HOLDER OF SINGLE-WAFER-TYPE FACILITIES FOR MANUFACTURING SEMICONDUCTOR

TRAY FOR SEMICONDUCTOR CHIP PACKAGE

YELLOW SOIL STEW BOTTLE

LIQUID CRYSTAL DISPLAY MODULE AND INFORMATION PROCESSING DEVICE USING THE MODULE

APPARATUS FOR CONTROLLING INDICATOR OF ELEVATOR

NOVEL QUINOLONE CARBOXYLIC ACID DERIVATIVE SUBSTITUTED WITH (3-AMINO-4- ALKYLOXIME)PIPERIDINE

DOUBLE-ACTING CAM IN ZIPPER PREPARATION APPARATUS

FRAME FOR COLOR CATHODE RAY TUBE

GETTER ASSEMBLY FOR PLANE CATHODE RAY TUBE AND SUPPORTING STRUCTURE THEREOF

CONSTITUTION OF FAUCET OPENED/CLOSED BY MAGNETIC FORCE AND WATER SUPPLYING/INTERCEPTING DEVICE AND MANUFACTURING METHOD THEREOF

METHOD FOR DETECTING DEFECTIVE WAFER

APPARATUS FOR OPENING AND CLOSING LOAD LOCK DOOR IN ION IMPLANTATION EQUIPMENT

CARRIER PACKAGE TEMPORARILY USED FOR TESTING CHIP

FILTERING APPARATUS FOR HARD DISK DRIVE

DEVICE OF FORMING GLASS

GLASS MELTING FURNACE

APPARATUS FOR ADJUSTING ELECTROMAGNETIC FIELD DISTRIBUTION OF MICROWAVE OVEN