发明名称 Teaching method and system for mounted component inspection.
摘要 <p>An operator actuates keyboard (22) to register board name of a board for teaching (ST11), sets a reference board (1S) on a Y-axis table unit (4) to actuate a start key (ST12), inputs reference points of the reference board (1S) to be set to an original position (ST13), takes a picture of a predetermined area of the reference board to teach a mounting position (ST14), and reads data about component image and its decision criteria of the corresponding component from a component kind table (19) to be stored as teaching data (ST15). This operation is repeatedly executed until all components are taught to a mounted component inspection device which inspects mounting qualities of a plurality of components mounted on an inspected board. <IMAGE></p>
申请公布号 EP0526080(A2) 申请公布日期 1993.02.03
申请号 EP19920306672 申请日期 1992.07.21
申请人 OMRON CORPORATION 发明人 KOBAYASHI, SHIGEKI;YAMAMOTO, NORIHITO
分类号 G01N21/956;G05B19/418 主分类号 G01N21/956
代理机构 代理人
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