High integration master-slice circuit with fault detection - has decoder, interrogation amplifier and shift register incorporated in each semiconductor element row

摘要

The high integration master-slice circuit with incorporated fault detection has function circuits (121,151,181,241) using a number of rows (10-25) of semiconductor elements formed in a substrate, supplied with a test signal via a decoder (214). A set of interrogation amplifiers (122,152,182,242) is used to detect a signal indicating a semiconductor component fault provided in response to the test signal. The amplifier output signals are fed to shift registers (123,153,183,243) determining the fault position. The interrogation amplifiers (122,152,182,242) and shift registers (1q23,153,183,243) are provided for each row and together with the shift registers are provided by a number of the semiconductor elements. ADVANTAGE - Reduced surface area with subsequent reduction in cost.